Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy
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Surface imaging
20nm Cluster
Stepped Si(111) surface
Chemically treated Si(111) surface
UMG03/Pt grating
Electron lithography pattern in Si
Polished steel surface
Polished steel surface 2
Porous alumina
Polymer grating
Semiconductive clusters on Si
Gold surface
Surface potential
Work function on Au/Pt test sample
Work function on Au/Pt sample
Au/Pt test grating
Advanced KPFM on p-epi-layers on n-Si
Advanced KPFM on p-epi-layers on p-Si
Christmas tree
Phase imaging
Gold surface with organic contamination
Gold on silicon
Polymer film with embedded gold clusters
Gold on silicon
Topography
Phase image
Image size: 1 µm x 1 µm
Height scale: 9 nm
Image size: 1 µm x 1 µm
Phase range: -2° … 39°
Simultaneously acquired surface topography and phase contrast
on organic contaminations on sputtered gold on glass