Anfatec Instruments AG

Measurement Science and Technology &
Scanning Probe Microscopy

The standard Level-AFM system consists of:

• a base plate made from Bianco Cristall with internal wiring
• vibration isolation
• microscope base:
• 3 integrated miniaturized stepper motors for head levelling
• lateral coarse positioning with 6 mm travel range
• self-adjustable grooves (head is always in same position)
• calibrated scanner (about 30 µm range)
• electrical contact to sample
  (can be used for Electrical Force Microscopy)
• standard AFM-head:
• laser diode maximum 3 mW, 670 nm with lens system
• laser adjustment in three axis
• integrated 4-quadrant photo-detector with amplifier electronics
• x-y-adjustment of the laser beam onto the photo detector
• built-in dither piezo for acoustical excitation in dynamic mode
• integrated illumination
• CCD-color-camera with special optic (top-view on the cantilever)
• uncomplicated mounting of the cantilever chips (clamp)
• high voltage amplifier V45C
• DS4L-Modul with Interface to the AMU 2.x card
  for control of the level station
• 8 x 24-bit D/A and 8 x 24-bit A/D converter channels
• Control computer:
• 64-bit AMD processor
• 19“ TFT monitor
• video card
• installed software: Windows XP Prof.,
  Anfatec Scan with GNU GPL, Anfatec Present
• Anfatec Measurement Interface AMU 2.x
  (PCI bus board with integrated LockIn amplifier)
• Accessories: 1 calibration grating UMG01,
  1 start-up set of cantilevers (15 pcs.), connection cables
• English or German manual, certain tutorials
  for NC AFM, contact AFM, Scanner calibration

News:

• Hardware:
• soft- or hardware-linearisation of the scanner
• AMU2.4 generation with better signal to noise ratio
• 2^nd trace imaging for MFM
• 2^nd internal LockIn amplifier for integrated Kelvin
  feedback and EFM imaging
• Software: much more scan mode options / 3D view /
  unit cell correction for molecular grids
• Mechanics/ Head: improved observability of the sample in the
  camera and sample illumination.