Anfatec Instruments AG

Measurement Science and Technology &
Scanning Probe Microscopy

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Home > Anfatec Products > Atomic Force Microscopes > Level AFM

Level AFM - the affordable solution for the basic needs


Specification of the Level AFM

  • lateral resolution: 0.19 nm (18 bit achieved technical resolution) / mathematical resolution: 32 Bit (< 0.1 pm)
  • height resolution: 0.026 nm (18 bit achieved technical resolution) / mathematical resolution: 64 Bit (<< 1 am)
  • maximum scan range: approx. 50 mm (standard, others possible on request)
  • maximum sample size: 4 cm x 4 cm
  • manual positioning range: 5 mm x 5 mm
  • accessories: 15 cantilevers; 1 calibration grating UMG01
       20 sample holders; 2 sample boxes, tweezers

System News:

  • hardware-linearisation 
  • improved HV-noise for higher resloution in combination with large scan range
  • new scan modes (e.g. SGM)
  • top view camera with sample illumination




Data Sheet
Optional Features
Microscope Description
Mechanics
Image Gallery