Anfatec Instruments AG

Measurement Science and Technology &
Scanning Probe Microscopy

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Home > Anfatec Products > Microscopes > Level AFM  > Optional Features

Optional Features

    • Vibration isolation table under the microscope
    • software type scanner linearisation is standard in our systems
    • Hardware scanner linearisation (feed forward type)
    • glass bell jar for acoustic protection
    • enhanced LFM mode sensitivity (circular laser diode)
    • EFM mode (LockIn amplifier, Kelvin feedback, signal mixer)
    • Calibration grating set UMG01/5
    • additional test pattern „Fisher-Pattern“
    • 15 standard cantilever (e.g. NSC15/15)
    • 50 standard cantilever (e.g. NSC15/50)
    • 15 Cantilever with conductive coating
    • SPIP-Basis-Modul
    • SPIP Software module for linearisation (further modules on request)
    • 2nd TFT monitor in 19“
table