Anfatec Instruments AG

Measurement Science and Technology &
Scanning Probe Microscopy

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HomeAnfatec Products >Atomic Force Microscopes > Level-AFM > Image Gallery


Image Gallery of the Level-AFM



Sample: 30 nm gold clusters on a Au(111)-surface
Scan range: 2 µm x 2 µm
Height scale: 35 nm
Tip: DP15/HiRes/AlBS (MikroMasch)
Sample courtesy: Mr. Plutowski, University of Karlsruhe



Sample: Porous alumina
Image range: 3 µm x 3 µm
Height scale: 940 nm
Mode: dynamic non-contact
Tip: DP15/STING/AlBS
Sample courtesy: MPI Halle

Sample: Atomic steps on a mica surface
Scan range: 5 µm x 5 µm
Height scale: 2.5 nm
Tip: NSC15/AlBS
Sample courtesy: TU Chemnitz

Sample: UMG01 
Scan range : 500 nm x 500 nm
Height scale: 5nm 
Mode: dynamic non-contact
Tip: NSC12/C
Sample courtesy: Anfatec

The linear arranged pollutions, which can always be found in the middle of the upraised area, are typical for the grating UMG01. As shown in the picture, they consist of  single, diffuse arranged dots.

Sample: 75 nm Alqb on silicon
Scan range: 3 µm x 3 µm
Height scale: 47 nm
Mode: dynamic non-contact
Tip: NSC15
Sample courtesy: TU Braunschweig
 

Sample: Printable polymer layer before etching
Image range: 3 µm x 3 µm
Height scale: 147 nm
Mode: dynamic non-contact
Tip: NSC15
Sample courtesy: TU Chemnitz


Sample: ITO on silicon
Scan range: 1 µm x 1 µm
Height scale: 26.4 nm
Mode: dynamic non-contact with 100 mV drive
Tip: NSC15/HiRes/AlBS
Sample courtesy: Anfatec


Sample: Printed metal dot on silicon 
Scan range : 1 µm x 1 µm
Height scale: 77 nm 
Mode: dynamic non-contact
Tip: NSC15
Sample courtesy:  University of Duisburg-Essen



Sample: Test of e-beam lithography on an Au-layer
Scan range: 2 µm x 2 µm
Height scale: 4 nm
Mode: dynamic non-contact
Tip: NSC15/STING
Sample courtesy: TU Chemnitz


Sample: Etched pitch in a dopant pattern
Scan range : 1 µm x 1 µm
Height scale: 347 nm 
Mode: dynamic non-contact
Tip: NSC15/STING
Sample courtesy:  TU Chemnitz



Sample: 20 nm thermical oxide on n-Si(100)
Kelvin-potential  image
Mode: dynamic mode with electrical excitation and Kelvin Feedback
Sample courtesy: TU Chemnitz, Carsten Mädler (AG H. Graaf)

The structures were created by
applying voltage pulses.