Anfatec Instruments AG
Measurement Science and Technology &
Scanning Probe Microscopy
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Eddy
> Optional Features
Optional features (not necessary for standard applications):
Vibration isolation table under the microscope
separate tip contact for EFM
scanner linearisation
glass bell jar for acoustic protection
additional cantilever packages and gratings
enhanced LFM mode sensitivity (spot like laser diode)
external lockin amplifier
SPIP – Danish software for image evaluation
2
nd
TFT monitor