Anfatec Instruments AGMeasurement Science and Technology &Copyright / Impressum
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a base plate made from stone with wiring,
vibration isolation
microscope base:
self-adjustable grooves (head is always in same position)
calibrated scanner (about 30 µm
range)
electrical contact to sample (can be used for Electrical Force Microscopy)
standard AFM-head
laser diode maximum 3 mW, 670 nm with lens system
laser adjustment in three axis
integrated 4-quadrant photo-detector with amplifier electronics
adjustment of the laser beam onto the photo detector in two directions (X, Y)
built-in dither piezo for acoustical excitation in dynamic mode
integrated illumination
color-camera
with microscope optic with a direct view onto the cantilever
uncomplicated mounting of the cantilever chips
high voltage amplifier V45C
DS4L-Modul with Interface to the AMU 2.x
control of the level station
Anfatec
Measurement Interface AMU 2.x
(PCI bus board with integrated LockIn
amplifier)
tools: 1 calibration grating UMG01, 1
start-up set of cantilevers (15 pcs.), connection cables
English or German manual, certain
tutorials for NC AFM, contact AFM, Scanner calibration
64-bit AMD processor
17“ TFT monitor
video card